McGinnis Award

The IEEE AUTOTESTCON Frank McGinnis Professional Achievement Award is given in the memory of the late Frank McGinnis of the Sperry Corporation, who was instrumental in bringing military automated test to the forefront of visibility for government and industry alike.  Mr. McGinnis founded the Navy Ad Hoc ATE Project for the Navy in 1975, under National Security Industrial Association (NSIA) leadership, to examine and recommend to the Navy a program of research and development to help increase the competency levels of automated test.  This led to a Joint Services ATE Project that started in 1978 and had a similar purpose, except the focus was tri-service.  The culmination was the formation in late 1980 of the SAIA Automated Test Committee, a permanent activity to maintain a focus on military automated test.  This activity is still vibrant and functioning, as a Committee of the National Defense Industrial Association (NDIA, successor to the NSIA) Systems Engineering Division.

The Professional Achievement Award was established in Frank McGinnis' memory and honor to recognize managers or professionals in the STE industry who have demonstrated long-term leadership in the field.  The Award is a renaming of the former AUTOTESTCON "Man Of The Year" award.  The award is presented at the AUTOTESTCON awards luncheon by the AUTOTESTCON Board Chair or Vice-Chair.  The Award includes a check in the amount of $2,000 and a prize item.


The McGinnis Professional Achievement Award is sponsored by the Board of Directors of IEEE AUTOTESTCON.

Award Criteria

  • Nominees must have clearly demonstrated outstanding professional leadership in the ATE field spanning a career
  • Nominees should have visibility to the outside world, beyond the normal functional duties of his/her organization
  • Demonstrated accomplishments should have significant impact across the automated test community
  • Nominees should have visible participation in IEEE AUTOTESTCON
  • Nominations may be submitted by any individual, regardless of affiliation
  • Nominations should be accompanied by a short biographical sketch, along with a short (300-500) word summary
  • Recommendation

Nomination & Balloting Process

  • Nominations are solicited each year by the AUTOTESTCON Board of Directors via a variety of means, including AUTOTESTCON attendees, AUTOTESTCON exhibitors, AUTOTESTCON Board Sponsoring Societies (I&M, AESS) and their magazines, various technical publications, AUTOTESTCON mailing and e-mail lists, personal contacts, etc.
  • Once nominations are received and screened to assure compliance with the established Criteria and Eligibility regulations, a final slate is prepared and submitted to the Board members for balloting.
  • Selection and notification of the award winner is completed in time to meet the AUTOTESTCON Proceedings publication deadline.


  • The McGinnis Award may only be received once by the same individual.  The former "AUTOTESTCON Man of the Year" is considered the predecessor award to the McGinnis award, and recipients of this award are included in this eligibility determination.  Prior recipients are listed below.
  • Only those individuals who have been active within the past two years shall be eligible for the award.
  • Current members of the Board of Directors are not eligible for this award.

Award Notification
The Agent of the Board informs the AUTOTESTCON Board Chairman of balloting results, and in turn the awardee is notified to help assure his/her attendance at the current AUTOTESTCON.  The awardee will be asked to submit a current photograph and biographical sketch to the Agent by 1 July of the current AUTOTESTCON year to allow publication in the Proceedings and the Conference Program.

Nominations for the Frank McGinnis award can be filled out with the following Nomination Form.  Please return form to:

Jim Leonard at or to
Judy Scharmann at

or to
Jim Leonard
IEEE AUTOTESTCON Board of Directors
12 Huntington Forest Ct. - E
St. Charles, MO 63301
Phone:  314-777-1932


  • Nomination package:  31 May 2010
  • Biographical Sketch and Photo (winners only):  1 July 2010

Frank McGinnis Award Winners
2009 - Leslie A. Orlidge
2008 - Peter H. Williamson
2007 - John W. Sheppard
2006 - Joseph C. O'Connell, Jr.
2005 - Donald Kump
2004 - William Ross
2001 - John Roche
1999 - Fred Liguori
1998 - Howard Savage
1997 - Robert G. Mager
1996 - Wright A. "Andy" Nodine
1995 - Milton G. Slade
1994 - Michael T. Ellis
1993 - John Colgan
1992 - Robert C. Rassa
1991 - Charles Scaturo
1990 - James A. (Bert) Houston
1989 - Oscar W. Sepp
1988 - Bernard P. Gollomp
1987 - Lee C. Paulson
1986 - Paul Giordano
1985 - Oliver T. Carver

Man of the Year Winners
1984 - Patrick M. Toscano
1981 - Bernard P. Gollomp
1980 - David M. Goodman
1979 - Fred Liguori

Farewell from AUTOTESTCON 2011

Farewell message from the AUTOTESTCON 2011 Committee:

Our volunteer committee was proud to host the 46th AUTOTESTCON at the Baltimore Convention Center from 12 - 15 September. This year's conference featured 264 exhibit booths, 2,000 total attendees and almost 80 superb technical papers presented in 27 sessions. 2011 was one of the most successful AUTOTESTCONs ever held. We appreciate the support from the 146 different exhibiting companies and organizations. And we are especially appreciative of the fine efforts of the US Army, Marine Corps and Navy which enabled us to display NGATS and RTCASS stations in their operational environments.

Hope to see you in Anaheim next September.
Bill Ross Signature

AUTOTESTCON 2011 Committee General Chair

Presentations from the AUTOTESTCON 2011 Technical Sessions

Pictures from AUTOTESTCON 2011


AUTOTESTCON is the world’s premier conference that brings together the military/aerospace automatic test industry and government/military acquirers and users to share new technologies, discuss innovative applications, and exhibit products and services. It is sponsored annually by the IEEE.

The Theme this year is Mission Assurance through Advanced ATE.

AUTOTESTCON will be held at the Disneyland Resort and Conference Center in Anaheim, California, on September 10-13, 2012. The TECHNICAL PROGRAM for AUTOTESTCON 2012 will be determined by the interests of those participants submitting for publication and presentation a TECHNICAL PAPER or organizing a TECHNICAL SESSION. Papers and sessions should cover appropriate topics dealing with SYSTEM READINESS in general and AUTOMATIC TEST technology in particular. ABSTRACTS for TECHNICAL PAPERS are now being solicited, as are proposals for TECHNICAL SESSIONS.

Important Aspects of Systems Readiness

  • Performance Based Logistics
  • Health Monitoring & Diagnostics
  • Embedded Instrumentation
  • Support Economics
  • Test & Support Management

Read more »


IEEE AUTOTESTCON is the United States’ largest conference focused on automatic test systems for US military systems, and has been held annually since 1965. The Conference, whose general theme is The Support Systems Technology Conference, is held in varying cities around the US each fall. Administered by a standing Board of Directors, the Conference typically presents over 120- quality application-focused papers with over 250 Exhibits, all focused precisely on the current issues facing military automated test. Attendance ranges between 650 and 750 (paid) attendees, with an additional 1,000 to 1,200 exhibitor and spouse attendees.

The perennial sponsors of IEEE AUTOTESTCON are the Aerospace & Electronic Systems Society, and the Instrumentation & Measurement Society. A third (optional) sponsor can be the local Section or Council within whose regional area the conference is held. This optional sponsorship is dependent on local participation and support within the Conference Committee.

AUTOTESTCON Dates & Locations:

2011 - Baltimore Convention Center, Baltimore, Maryland, September 12-15, 2011
2012 - Disneyland Resort, Anaheim, California, September 10-13, 2012
2013 - Chicago, IL, September 16-19, 2013
2014 - St Louis, MO, September 15-18, 2014

For additional information on IEEE AUTOTESTCON, contact the Board Chair, Bob Rassa, at

To be added to the official IEEE AUTOTESTCON Mailing List, contact Mr. Chris Dyer at